Malvern Panalytical Aeris Benchtop XRD System 9430 070 99991

The Malvern Panalytical Aeris Benchtop XRD System 9430 070 99991 is a compact benchtop X-ray diffractometer designed for rapid, routine phase identification and quantitative XRD analysis in laboratories and production environments. The system provides fast, reproducible diffraction results (precise results in under five minutes) using Cu or Co radiation and supports external sample loading with manual, 6-position or 67-position high-capacity sample changers for low- to high-throughput workflows. The instrument is intended for applications such as minerals, metals and cement analysis, teaching, and industrial process control where automated integration and regulated-environment compatibility are required.

Key Features:

• Form factor: Benchtop (external sample loading)
• Manufacturer part/model: 9430 070 99991
• X-ray wavelength options: Cu or Co
• X-ray tube power/settings: 300 W to 600 W; selectable 30 kV or 40 kV
• Detector options: 0D, 1D and PIXcel3D 2D solid-state hybrid pixel detector
• Sample handling: manual loading, 6-position sample changer, or 67-position high-capacity sample changer
• Infrastructure: single-phase power socket; no cooling water, chiller or compressed air required

Advantages:

• Fast, high-quality data acquisition with precise results in as few as five minutes, enabling rapid decision-making
• Flexible throughput options from single-sample manual loading to fully automated 67-position high-capacity sample changing
• Low laboratory infrastructure requirements and easy integration into automated workflows
• Compatibility with regulated environments and controlled user access for compliant workflows